The article proposes an approach to determine the technical condition of the terminal components of the technological system, the basis of which are microprocessor systems implemented on software-reconfigurable logic. The existing methods and methods of testing programmable logic integrated circuits are analyzed, the shortcomings and advantages are revealed. It has been proven that the most effective method of using self-diagnosis schemes is BIST — Built-Inself-Test, which in the future can become the basis for monitoring and diagnosing microprocessor systems implemented on a software-reconfigurable element base. The existing methods of determining the technical condition of microprocessor systems implemented on large/very large integrated circuits with rigid architecture are considered, and the mathematical basis of their technical diagnosis is presented. In order to increase the cyber resistance of the terminal components of the technological system, it is proposed to use programmable logic integrated circuits as an element base, which are able to change the internal algorithmic structure by reprogramming as a result of cyber incidents and cyber attacks. At the same time, the rec
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